modern probe table equipment for the integrated circuits testing in the laboratory and analysis grain, noie effect and toned - Photo #2543465 - AI Generated Stock Photography - An experiment created with Redmond.ai

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modern probe table equipment for the integrated circuits testing in the laboratory and analysis grain, noie effect and toned

modern probe table equipment for the integrated circuits testing in the laboratory and analysis grain, noie effect and toned

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background board chip cmm computer coordinate crystal digital dimension electronic equipment future ic industrial industry inspection integrated circuit investigation lab laboratory machine manufacturing measure measurement metal needle part precision probe process production quality research science semiconductor sensor silicon steel study technology test tool wafer

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Published on Nov 09, 2022
Photo type JPG
Category Technology